Pastāsti draugiem par šo preci:
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing Mohammad Tehranipoor Softcover reprint of hardcover 1st ed. 2008 edition
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing
Mohammad Tehranipoor
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes.
422 pages, black & white illustrations
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2010. gada 23. novembris |
| ISBN13 | 9781441945136 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 408 |
| Izmēri | 155 × 235 × 21 mm · 589 g |
| Valoda | Angļu |
| Redaktors | Tehranipoor, Mohammad |
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