Mohammad Tehranipoor
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing Mohammad Tehranipoor 2008 edition

Name: Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing
Price: 181.99 EUR
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Author: Mohammad Tehranipoor

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Paperback Book

Softcover reprint of hardcover 1st ed. 2008 edition

(2010) € 181,99

Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing

Mohammad Tehranipoor

2008 edition

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes.

424 pages, 1, black & white illustrations

Mediji	Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku)
Izlaists	2007. gada 10. decembris
ISBN13	9780387747460
Izdevēji	Springer-Verlag New York Inc.
Lapas	408
Izmēri	155 × 235 × 23 mm · 811 g
Valoda	Angļu
Redaktors	Tehranipoor, Mohammad