Leendert M. Huisman
Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing Leendert M. Huisman Softcover reprint of hardcover 1st ed. 2005 edition

Name: Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing
Price: 119.99 EUR
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Author: Leendert M. Huisman

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Hardcover Book

2005 edition

(2005) € 103,49

Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing

Leendert M. Huisman

Softcover reprint of hardcover 1st ed. 2005 edition

The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part.

250 pages, 46 black & white illustrations, biography

Mediji	Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru)
Izlaists	2010. gada 8. decembris
ISBN13	9781441937674
Izdevēji	Springer-Verlag New York Inc.
Lapas	250
Izmēri	155 × 235 × 14 mm · 385 g