Pastāsti draugiem par šo preci:
Thermal Testing of Integrated Circuits J. Altet 2002 edition
Thermal Testing of Integrated Circuits
J. Altet
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
204 pages, 102 black & white illustrations, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2002. gada 30. jūnijs |
| ISBN13 | 9781402070761 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 204 |
| Izmēri | 160 × 240 × 14 mm · 539 g |
| Valoda | Angļu |