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Life-Cycle Assessment of Semiconductors Sarah B. Boyd 2012 edition
Life-Cycle Assessment of Semiconductors
Sarah B. Boyd
Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices.
226 pages, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2014. gada 17. septembris |
| ISBN13 | 9781489992239 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 226 |
| Izmēri | 155 × 235 × 14 mm · 362 g |
| Valoda | Angļu |