Pastāsti draugiem par šo preci:
Reliability of Microtechnology: Interconnects, Devices and Systems Johan Liu 2011 edition
Reliability of Microtechnology: Interconnects, Devices and Systems
Johan Liu
Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems.
204 pages, 50 black & white tables, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2014. gada 11. oktobris |
| ISBN13 | 9781489982117 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 204 |
| Izmēri | 155 × 235 × 12 mm · 312 g |
| Valoda | Angļu |