High Performance Memory Testing: Design Principles, Fault Modeling and Self-test - Frontiers in Electronic Testing - R. Dean Adams - Grāmatas - Springer-Verlag New York Inc. - 9781475784749 - 2013. gada 26. aprīlis
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R. Dean Adams
High Performance Memory Testing: Design Principles, Fault Modeling and Self-test - Frontiers in Electronic Testing Softcover Reprint of the Original 1st Ed. 2003 edition

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Paredzamā piegāde . gada 30. jūl. - . gada 7. aug.
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Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

250 pages, biography

Mediji Grāmatas     Paperback Book   (Grāmata ar mīksto vāku un līmēto muguru)
Izlaists 2013. gada 26. aprīlis
ISBN13 9781475784749
Izdevēji Springer-Verlag New York Inc.
Lapas 250
Izmēri 155 × 235 × 14 mm   ·   376 g
Valoda Angļu  

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