Benoit Nadeau-dostie
Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing Benoit Nadeau-dostie Softcover reprint of the original 1st ed. 2000 edition

Name: Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing
Price: 152.99 EUR
Availability: OutOfStock
Author: Benoit Nadeau-dostie

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Hardcover Book

2000 edition

(1999) € 152,99

Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing

Benoit Nadeau-dostie

Softcover reprint of the original 1st ed. 2000 edition

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels.

239 pages, biography

Mediji	Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru)
Izlaists	2013. gada 26. aprīlis
ISBN13	9781475782912
Izdevēji	Springer-Verlag New York Inc.
Lapas	239
Izmēri	178 × 254 × 14 mm · 458 g
Valoda	Angļu
Redaktors	Nadeau-Dostie, Benoit