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Point and Extended Defects in Semiconductors - NATO Science Series B Giorgio Benedek Softcover reprint of the original 1st ed. 1989 edition
Point and Extended Defects in Semiconductors - NATO Science Series B
Giorgio Benedek
The systematic study of defects in semiconductors began in the early fifties. Most participants are currently working on defect problems in either silicon submicron technology or in quantum wells and superlattices, where point defects, dislocations, interfaces and surfaces are closely packed together.
300 pages, black & white illustrations
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2013. gada 16. aprīlis |
| ISBN13 | 9781468457117 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 287 |
| Izmēri | 178 × 254 × 15 mm · 521 g |
| Valoda | Angļu |
| Redaktors | Benedek, Giorgio |
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