Pastāsti draugiem par šo preci:
Surface and Interface Characterization by Electron Optical Methods - Nato ASI Subseries B: Ugo Valdre Softcover reprint of the original 1st ed. 1988 edition
Surface and Interface Characterization by Electron Optical Methods - Nato ASI Subseries B:
Ugo Valdre
The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident.
319 pages, 156 black & white illustrations, 3 colour illustrations
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2012. gada 25. novembris |
| Oriģinālā izdošanas datums | 1989 |
| ISBN13 | 9781461595397 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 319 |
| Izmēri | 170 × 244 × 17 mm · 530 g |
| Valoda | Angļu |
| Redaktors | Valdre, Ugo |