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Bias Temperature Instability for Devices and Circuits Tibor Grasser 2014 edition
Bias Temperature Instability for Devices and Circuits
Tibor Grasser
Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
864 pages, 283 black & white illustrations, 318 colour illustrations, 22 black & white tables, biogr
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2013. gada 23. oktobris |
| ISBN13 | 9781461479086 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 810 |
| Izmēri | 158 × 241 × 50 mm · 1,50 kg |
| Valoda | Angļu |
| Redaktors | Grasser, Tibor |