Pastāsti draugiem par šo preci:
Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield Mohamed Abu Rahma 2013 edition
Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield
Mohamed Abu Rahma
This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.
210 pages, 147 black & white illustrations, 6 colour illustrations, 5 black & white tables, biograph
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2012. gada 27. septembris |
| ISBN13 | 9781461417484 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 172 |
| Izmēri | 155 × 235 × 15 mm · 385 g |
| Valoda | Angļu |
Vairāk no tā paša izdevēja
Skatīt visus Mohamed Abu Rahma ( piem., Hardcover Book un Paperback Book )