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Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield Mohamed Abu Rahma 2013 edition
Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield
Mohamed Abu Rahma
This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.
172 pages, 5 black & white tables, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2014. gada 15. oktobris |
| ISBN13 | 9781493902200 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 172 |
| Izmēri | 155 × 235 × 10 mm · 272 g |
| Valoda | Angļu |
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