Pastāsti draugiem par šo preci:
Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science Lawrence C Wagner Softcover reprint of the original 1st ed. 1999 edition
Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science
Lawrence C Wagner
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
255 pages, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2012. gada 9. novembris |
| ISBN13 | 9781461372318 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 255 |
| Izmēri | 155 × 235 × 14 mm · 385 g |
| Valoda | Angļu |
| Redaktors | Wagner, Lawrence C. |
Vairāk no tā paša izdevēja
Skatīt visus Lawrence C Wagner ( piem., Hardcover Book un Paperback Book )