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Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science Lawrence C Wagner 1999 edition
Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science
Lawrence C Wagner
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
255 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 1999. gada 31. janvāris |
| ISBN13 | 9780412145612 |
| Izdevēji | Chapman and Hall |
| Lapas | 255 |
| Izmēri | 155 × 235 × 17 mm · 589 g |
| Valoda | Angļu |
| Redaktors | Wagner, Lawrence C. |