Pastāsti draugiem par šo preci:
Hot-carrier Reliability of Mos Vlsi Circuits - the Springer International Series in Engineering and Computer Science Yusuf Leblebici Softcover Reprint of the Original 1st Ed. 1993 edition
Hot-carrier Reliability of Mos Vlsi Circuits - the Springer International Series in Engineering and Computer Science
Yusuf Leblebici
229 pages, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2012. gada 27. septembris |
| ISBN13 | 9781461364290 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 229 |
| Izmēri | 155 × 235 × 13 mm · 335 g |
| Valoda | Angļu |