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Hot-Carrier Reliability of MOS VLSI Circuits - The Springer International Series in Engineering and Computer Science Yusuf Leblebici 1993 edition
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Hot-Carrier Reliability of MOS VLSI Circuits - The Springer International Series in Engineering and Computer Science
Yusuf Leblebici
The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits.
229 pages, biography
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