Erik Larsson
Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing Erik Larsson Softcover reprint of hardcover 1st ed. 2005 edition

Name: Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing
Price: 152.99 EUR
Availability: OutOfStock
Author: Erik Larsson

Cena

€ 152,99

Pasūtīts no attālās noliktavas

Paredzamā piegāde . gada 30. jūl. - . gada 7. aug.

Saņemiet paziņojumus par jauniem Erik Larsson izdevumiem

Mūsu klienti saka:

Top-vurdering på Google Reviews, baseret på tusinder af anmeldelser.

14 dienu atgriešanas politika saskaņā ar Eiropas patērētāju tiesību aizsardzības likumu

Top vieta Trustpilot

Pievienot savam iMusic vēlmju sarakstam

Not rated yet

Pieejams arī kā:

Hardcover Book

2005 edition

(2005) € 152,99

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing

Erik Larsson

Softcover reprint of hardcover 1st ed. 2005 edition

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.

388 pages, biography

Mediji	Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru)
Izlaists	2011. gada 2. februāris
Oriģinālā izdošanas datums	2010
ISBN13	9781441952691
Izdevēji	Springer-Verlag New York Inc.
Lapas	388
Izmēri	150 × 220 × 10 mm · 571 g
Valoda	Angļu