Erik Larsson
Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing Erik Larsson 2005 edition

Name: Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing
Price: 152.99 EUR
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Author: Erik Larsson

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Paperback Book

Softcover reprint of hardcover 1st ed. 2005 edition

(2011) € 152,99

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing

Erik Larsson

2005 edition

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.

388 pages, biography

Mediji	Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku)
Izlaists	2005. gada 7. novembris
ISBN13	9781402032073
Izdevēji	Springer-Verlag New York Inc.
Lapas	388
Izmēri	156 × 232 × 23 mm · 1,09 kg
Valoda	Angļu