Pastāsti draugiem par šo preci:
High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Advanced Texts in Physics Ullrich Pietsch 2nd ed. 2004 edition
High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Advanced Texts in Physics
Ullrich Pietsch
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.
428 pages, 389 black & white illustrations, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2004. gada 27. augusts |
| ISBN13 | 9780387400921 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 408 |
| Izmēri | 155 × 235 × 23 mm · 816 g |
| Valoda | Angļu |