Pastāsti draugiem par šo preci:
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science Stefan Rein Softcover reprint of hardcover 1st ed. 2005 edition
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science
Stefan Rein
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques.
492 pages, 29 black & white tables, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2010. gada 19. oktobris |
| ISBN13 | 9783642064531 |
| Izdevēji | Springer-Verlag Berlin and Heidelberg Gm |
| Lapas | 492 |
| Izmēri | 155 × 235 × 26 mm · 721 g |
| Valoda | Angļu |