Pastāsti draugiem par šo preci:
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science Stefan Rein 2005 edition
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science
Stefan Rein
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques.
492 pages, 29 black & white tables, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2005. gada 23. jūnijs |
| ISBN13 | 9783540253037 |
| Izdevēji | Springer-Verlag Berlin and Heidelberg Gm |
| Lapas | 492 |
| Izmēri | 241 × 166 × 37 mm · 950 g |
| Valoda | Angļu Vācu |
Ziemassvētku dāvanas var atgriezt līdz 31. janvārim