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ISTFA (TM) 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis ASM International
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ISTFA (TM) 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis
ASM International
Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!
500 pages
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2016. gada 30. janvāris |
| ISBN13 | 9781627081023 |
| Izdevēji | A S M International |
| Lapas | 500 |
| Izmēri | 150 × 220 × 10 mm · 749 g (Svars (aptuveni)) |
