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High Quality Test Pattern Generation and Boolean Satisfiability Stephan Eggersgluss 2012 edition
High Quality Test Pattern Generation and Boolean Satisfiability
Stephan Eggersgluss
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.
193 pages, 52 black & white tables, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2014. gada 20. oktobris |
| ISBN13 | 9781489988478 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 193 |
| Izmēri | 155 × 235 × 11 mm · 303 g |
| Valoda | Angļu |