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Ion Beam Surface Layer Analysis: Volume 2 Otto Meyer Softcover reprint of the original 1st ed. 1976 edition
Ion Beam Surface Layer Analysis: Volume 2
Otto Meyer
The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no vel applications.
508 pages, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2012. gada 30. janvāris |
| ISBN13 | 9781461588818 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 491 |
| Izmēri | 178 × 254 × 26 mm · 879 g |
| Valoda | Angļu |
| Redaktors | Meyer, Otto |
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