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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces - Springer Theses Weronika Walkosz 2011 edition
Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces - Springer Theses
Weronika Walkosz
This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
176 pages, 2 black & white tables, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2013. gada 28. maijs |
| ISBN13 | 9781461428572 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 110 |
| Izmēri | 155 × 235 × 6 mm · 185 g |
| Valoda | Angļu |
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Skatīt visus Weronika Walkosz ( piem., Hardcover Book un Paperback Book )