Jitendra B. Khare
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing Jitendra B. Khare Softcover reprint of the original 1st ed. 1996 edition

Name: From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing
Price: 119.49 EUR
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Author: Jitendra B. Khare

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Hardcover Book

1996 edition

(1996) € 119,49

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing

Jitendra B. Khare

Softcover reprint of the original 1st ed. 1996 edition

Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

150 pages, biography

Mediji	Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru)
Izlaists	2011. gada 26. septembris
ISBN13	9781461285953
Izdevēji	Springer-Verlag New York Inc.
Lapas	150
Izmēri	155 × 235 × 9 mm · 249 g
Valoda	Angļu