Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science - Hisham Haddara - Grāmatas - Springer-Verlag New York Inc. - 9781461285847 - 2011. gada 26. septembris
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Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1995 edition

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The need for more deep and extensive characterization of MOSFET param eters has further increased as the applications of this device have gained ground in many new fields in which its performance has become more and more sensi tive to the properties of its Si - Si0 interface.


232 pages, biography

Mediji Grāmatas     Paperback Book   (Grāmata ar mīksto vāku un līmēto muguru)
Izlaists 2011. gada 26. septembris
ISBN13 9781461285847
Izdevēji Springer-Verlag New York Inc.
Lapas 232
Izmēri 155 × 235 × 13 mm   ·   358 g
Valoda Angļu  
Redaktors Haddara, Hisham

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