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Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science Hisham Haddara 1995 edition
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Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science
Hisham Haddara
The need for more deep and extensive characterization of MOSFET param eters has further increased as the applications of this device have gained ground in many new fields in which its performance has become more and more sensi tive to the properties of its Si - Si0 interface.
232 pages, biography
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