Soft Errors in Modern Electronic Systems - Frontiers in Electronic Testing - Michael Nicolaidis - Grāmatas - Springer-Verlag New York Inc. - 9781441969927 - 2010. gada 30. septembris
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Soft Errors in Modern Electronic Systems - Frontiers in Electronic Testing 2011 edition

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Provides a comprehensive presentation of the research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, and more.


336 pages, biography

Mediji Grāmatas     Hardcover Book   (Grāmata ar cieto muguriņu un vāku)
Izlaists 2010. gada 30. septembris
ISBN13 9781441969927
Izdevēji Springer-Verlag New York Inc.
Lapas 318
Izmēri 155 × 235 × 19 mm   ·   644 g
Valoda Angļu  
Redaktors Nicolaidis, Michael

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