Pastāsti draugiem par šo preci:
CTL for Test Information of Digital ICs Rohit Kapur 2002 edition
CTL for Test Information of Digital ICs
Rohit Kapur
From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability
173 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2002. gada 31. oktobris |
| ISBN13 | 9781402072932 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 173 |
| Izmēri | 155 × 235 × 12 mm · 439 g |
| Valoda | Angļu |