Pastāsti draugiem par šo preci:
Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices - NATO Science Series II E Gusev 2006 edition
Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices - NATO Science Series II
E Gusev
Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-K Dielectric Nano-Electronic Semiconductor Devices, St. Petersburg, Russia, from 11 to 14 July 2005.
492 pages, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2006. gada 27. janvāris |
| ISBN13 | 9781402043666 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 492 |
| Izmēri | 155 × 235 × 25 mm · 703 g |
| Valoda | Angļu |
| Redaktors | Gusev, Evgeni |