Pastāsti draugiem par šo preci:
Scanning Microscopy for Nanotechnology: Techniques and Applications Weilie Zhou 2007 edition
Scanning Microscopy for Nanotechnology: Techniques and Applications
Weilie Zhou
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book will appeal to nanomaterials researchers, and to SEM development specialists.
552 pages, 399 black & white illustrations, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2006. gada 27. novembris |
| ISBN13 | 9780387333250 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 522 |
| Izmēri | 155 × 235 × 30 mm · 1,05 kg |
| Valoda | Angļu |
| Redaktors | Wang, Zhong Lin |
| Redaktors | Zhou, Weilie |