Pastāsti draugiem par šo preci:
Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science Johann-Martin Spaeth Softcover reprint of the original 1st ed. 2003 edition
Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science
Johann-Martin Spaeth
The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap peared about 10 years ago.
492 pages, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2012. gada 14. septembris |
| ISBN13 | 9783642627224 |
| Izdevēji | Springer-Verlag Berlin and Heidelberg Gm |
| Lapas | 492 |
| Izmēri | 155 × 235 × 25 mm · 703 g |
| Valoda | Angļu |
| Ieguldītājs | Hans-Joachim Queisser |
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