Pastāsti draugiem par šo preci:
Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science Johann-Martin Spaeth 2003 edition
Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science
Johann-Martin Spaeth
The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap peared about 10 years ago.
492 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2003. gada 22. janvāris |
| ISBN13 | 9783540426950 |
| Izdevēji | Springer-Verlag Berlin and Heidelberg Gm |
| Lapas | 492 |
| Izmēri | 155 × 235 × 28 mm · 884 g |
| Valoda | Angļu Vācu |
| Ieguldītājs | Hans-Joachim Queisser |