Pastāsti draugiem par šo preci:
Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics Hui Xie 2012 edition
Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics
Hui Xie
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.
344 pages, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2014. gada 26. novembris |
| ISBN13 | 9783642445019 |
| Izdevēji | Springer-Verlag Berlin and Heidelberg Gm |
| Lapas | 344 |
| Izmēri | 155 × 235 × 19 mm · 503 g |
| Valoda | Angļu |