Pastāsti draugiem par šo preci:
Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics Hui Xie 2011 edition
Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics
Hui Xie
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.
360 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2011. gada 28. septembris |
| ISBN13 | 9783642203282 |
| Izdevēji | Springer-Verlag Berlin and Heidelberg Gm |
| Lapas | 344 |
| Izmēri | 155 × 235 × 25 mm · 612 g |
| Valoda | Franču |