Pastāsti draugiem par šo preci:
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact - Springer Series in Materials Science Cor Claeys 1st ed. 2018 edition
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact - Springer Series in Materials Science
Cor Claeys
material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
438 pages, 207 Illustrations, color; 8 Illustrations, black and white; XXXIII, 438 p. 215 illus., 20
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2018. gada 22. augusts |
| ISBN13 | 9783319939247 |
| Izdevēji | Springer International Publishing AG |
| Lapas | 438 |
| Izmēri | 150 × 220 × 20 mm · 834 g |
| Valoda | Franču |
Vairāk no Cor Claeys
Rādīt visuVairāk no tā paša izdevēja
Skatīt visus Cor Claeys ( piem., Hardcover Book un Paperback Book )