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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact - Springer Series in Materials Science Cor Claeys Softcover reprint of the original 1st ed. 2018 edition
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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact - Springer Series in Materials Science
Cor Claeys
material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
438 pages, 207 Illustrations, color; 8 Illustrations, black and white; XXXIII, 438 p. 215 illus., 20
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2019. gada 30. janvāris |
| ISBN13 | 9783030067472 |
| Izdevēji | Springer Nature Switzerland AG |
| Lapas | 438 |
| Izmēri | 232 × 154 × 28 mm · 698 g |
| Valoda | Vācu |