Pastāsti draugiem par šo preci:
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM R.F. Egerton Softcover reprint of the original 2nd ed. 2016 edition
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
R.F. Egerton
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.
196 pages, 15 Illustrations, color; 109 Illustrations, black and white; XI, 196 p. 124 illus., 15 il
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2018. gada 30. maijs |
| ISBN13 | 9783319819860 |
| Izdevēji | Springer International Publishing AG |
| Lapas | 196 |
| Izmēri | 234 × 156 × 16 mm · 334 g |
| Valoda | Vācu |