Pastāsti draugiem par šo preci:
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM R.F. Egerton 2nd ed. 2016 edition
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
R.F. Egerton
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.
207 pages, 109 black & white illustrations, 15 colour illustrations, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2016. gada 7. jūlijs |
| ISBN13 | 9783319398761 |
| Izdevēji | Springer International Publishing AG |
| Lapas | 196 |
| Izmēri | 165 × 243 × 22 mm · 471 g |
| Valoda | Vācu |