Pastāsti draugiem par šo preci:
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences 2018 edition
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences
521 pages, 40 Tables, color; 194 Illustrations, color; 40 Illustrations, black and white; XXIV, 521
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2018. gada 19. marts |
| ISBN13 | 9783319756868 |
| Izdevēji | Springer International Publishing AG |
| Lapas | 521 |
| Izmēri | 242 × 167 × 38 mm · 986 g |
| Valoda | Vācu |
| Redaktors | Glatzel, Thilo |
| Redaktors | Sadewasser, Sascha |