Pastāsti draugiem par šo preci:
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences Softcover Reprint of the Original 1st 2018 edition
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences
521 pages, 40 Tables, color; 194 Illustrations, color; 40 Illustrations, black and white; XXIV, 521
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2019. gada 4. janvāris |
| ISBN13 | 9783030092986 |
| Izdevēji | Springer Nature Switzerland AG |
| Lapas | 521 |
| Izmēri | 150 × 220 × 10 mm · 757 g |
| Valoda | Vācu |
| Redaktors | Glatzel, Thilo |
| Redaktors | Sadewasser, Sascha |