Pastāsti draugiem par šo preci:
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics Peter Pichler 2004 edition
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics
Peter Pichler
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon.
554 pages, 40 black & white illustrations, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2004. gada 2. jūnijs |
| ISBN13 | 9783211206874 |
| Izdevēji | Springer Verlag GmbH |
| Lapas | 554 |
| Izmēri | 178 × 254 × 31 mm · 1,18 kg |
| Valoda | Angļu Vācu |
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