Pastāsti draugiem par šo preci:
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization Sheldon Tan 2019 edition
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Sheldon Tan
460 pages, 195 Illustrations, color; 16 Illustrations, black and white; XLI, 460 p. 211 illus., 195
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2020. gada 25. septembris |
| ISBN13 | 9783030261740 |
| Izdevēji | Springer Nature Switzerland AG |
| Lapas | 460 |
| Izmēri | 150 × 220 × 10 mm · 765 g |
| Valoda | Vācu |