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Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization Sheldon Tan 2019 edition
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Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Sheldon Tan
460 pages, 195 Illustrations, color; 16 Illustrations, black and white; XLI, 460 p. 211 illus., 195
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2019. gada 25. septembris |
| ISBN13 | 9783030261719 |
| Izdevēji | Springer Nature Switzerland AG |
| Lapas | 460 |
| Izmēri | 150 × 220 × 20 mm · 916 g |
| Valoda | Vācu |
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