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Multi-run Memory Tests for Pattern Sensitive Faults Ireneusz Mrozek Softcover reprint of the original 1st ed. 2019 edition
Multi-run Memory Tests for Pattern Sensitive Faults
Ireneusz Mrozek
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.
135 pages, 50 Tables, color; 34 Illustrations, black and white; X, 135 p. 34 illus.
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2019. gada 1. februāris |
| ISBN13 | 9783030081980 |
| Izdevēji | Springer Nature Switzerland AG |
| Lapas | 135 |
| Izmēri | 150 × 220 × 10 mm · 454 g |
| Valoda | Vācu |