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X-Ray Diffraction for Materials Research: From Fundamentals to Applications Myeongkyu Lee 1. izdevums
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X-Ray Diffraction for Materials Research: From Fundamentals to Applications
Myeongkyu Lee
This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how
302 pages, 219 black & white illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2016. gada 11. februāris |
| ISBN13 | 9781771882989 |
| Izdevēji | Apple Academic Press Inc. |
| Lapas | 302 |
| Izmēri | 152 × 229 × 23 mm · 720 g |
| Valoda | Angļu |
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