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ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis ASM International
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ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis
ASM International
The International Symposium for Testing and Failure Analysis is the premier event for scientists and engineers who work to evaluate failures and improve the performance and reliability of semiconductor devices and processing techniques. This ISTFA 2020 publication includes the papers that were accepted for the planned 2020 conference.
396 pages
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2020. gada 30. oktobris |
| ISBN13 | 9781627083331 |
| Izdevēji | A S M International |
| Lapas | 396 |
| Izmēri | 150 × 220 × 10 mm · 970 g |
