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ISTFA 2016 Proceedings from the 42nd International Symposium for Testing and Failure Analysis ASM International
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ISTFA 2016 Proceedings from the 42nd International Symposium for Testing and Failure Analysis
ASM International
Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, "The Next Generation FA Engineer".
500 pages
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2016. gada 30. oktobris |
| ISBN13 | 9781627081351 |
| Izdevēji | A S M International |
| Lapas | 500 |
| Izmēri | 150 × 220 × 10 mm · 749 g (Svars (aptuveni)) |